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US6038124: Aluminum electrode foil for electrolytic capacitor and electrolytic capacitor using the foil

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Filing Information

Inventor(s) Hidenori Uchi · Masakazu Furukawa · Tadao Fujihira · Ichizo Tsukuda · Eizo Isoyama ·
Assignee(s) KDK Corporation · Showa Aluminum Corporation ·
Primary Examiner Kristine Kincaid ·
Assistant Examiner Eric W. Thomas ·
Application Number US8995967
Filing date 12/22/1997
Issue date 03/14/2000
Predicted expiration date 12/22/2017
U.S. Classifications 361/509  · 361/500  ·
International Classifications H01G 904  ·
Kind CodeA
International Classifications 361500;502;503;508;509;523;525;528;529;532 ·
Foreign Priority JP8359898 - 12/25/1996 ·
23 Claims, No Drawings


Abstract

An aluminum electrode foil for an electrolytic capacitor has a sponge-like etching layer formed on at least one of the surfaces thereof, and the sponge-like etching layer is reduced in a direction of thickness. The aluminum density of the reduced sponge-like etching layer `d2` is set from 0.8 to 2.2 g/cm.sup.3.

Independent Claims | See all claims (23)

  1. 1. An aluminum electrode foil for an electrolytic capacitor characterized in that a sponge-like etching layer is formed on at least one surface of said foil, said sponge-like etching layer is reduced in the direction of thickness, and aluminum density of said sponge-like etching layer after reduction `d2` is set from 0.8 to 2.2 g/cm.sup.3.
  2. 12. An aluminum electrode foil for an electrolytic capacitor characterized in that a sponge-like etching layer is formed on at least one surface of said foil, said sponge-like etching layer is reduced in the direction of thickness, aluminum density of said sponge-like etching layer before reduction `d1` is set at 0.6 g/cm.sup.3 to 1.0 g/cm.sup.3, and aluminum density of said sponge-like etching layer after reduction `d2` is set from 0.8 to 2.2 g/cm.sup.3.
  3. 13. An aluminum electrode foil for an electrolytic capacitor characterized in that a sponge-like etching layer is formed on at least one surface of said foil, said sponge-like etching layer is reduced in the direction of thickness, aluminum density of said sponge-like etching layer after reduction `d2` is set from 0.8 to 2.2 g/cm.sup.3, and a ratio `d2/d1` of the aluminum density of said sponge-like etching layer after reduction `d2` to that of said layer before reduction `d1` is from 1.2 to 3.7.
  4. 14. An aluminum electrode foil for an electrolytic capacitor characterized in that a sponge-like etching layer is formed on at least one surface of said foil, said sponge-like etching layer is reduced in the direction of thickness, aluminum density of said sponge-like etching layer before reduction `d1` is 0.6 g/cm.sup.3 to 1.0 g/cm.sup.3, aluminum density of said sponge-like etching layer after reduction `d2` is set from 0.8 to 2.2 g/cm.sup.3, and a ratio `d2/d1` of aluminum density of said sponge-like etching layer after reduction `d2` to that of said layer before reduction `d1` is from 1.2 to 3.7.
  5. 15. An aluminum electrode foil for an electrolytic capacitor characterized in that a sponge-like etching layer is formed on at least one surface of said foil, said sponge-like etching layer is reduced in the direction of thickness, aluminum density of said sponge-like etching layer after reduction `d2` is set from 0.8 to 2.2 g/cm.sup.3, and annealing is carried out at a temperature from 200 to 500.degree. C. after reduction.
  6. 16. An aluminum electrode foil for an electrolytic capacitor characterized in that a sponge-like etching layer is formed on at least one surface of said foil, said sponge-like etching layer is reduced in the direction of thickness, aluminum density of said sponge-like etching layer before reduction `d1` is 0.6 g/cm.sup.3 to 1.0 g/cm.sup.3, aluminum density of said sponge-like etching layer after reduction `d2` is set from 0.8 to 2.2 g/cm.sup.3, and annealing is carried out at a temperature from 200 to 500.degree. C. after reduction.
  7. 17. An aluminum electrode foil for an electrolytic capacitor characterized in that a sponge-like etching layer is formed on at least one surface of said foil, said sponge-like etching layer is reduced in the direction of thickness, aluminum density of said sponge-like etching layer after reduction `d2` is set from 0.8 to 2.2 g/cm.sup.3, a ratio `d2/d1` of aluminum density of said sponge-like etching layer after reduction `d2` to that of the layer before reduction `d1` is from 1.2 to 3.7, and annealing is carried out after reduction at a temperature from 200 to 500.degree. C.
  8. 18. An aluminum electrode foil for an electrolytic capacitor characterized in that a sponge-like etching layer is formed on at least one surface of said foil, said sponge-like etching layer is reduced in the direction of thickness, aluminum density of said sponge-like etching layer before reduction `d1` is 0.6 g/cm.sup.3 to 1.0 g/cm.sup.3, aluminum density of said sponge-like etching layer after reduction `d2` is set from 0.8 to 2.2 g/cm.sup.3, a ratio `d2/d1` of aluminum density of said sponge-like etching layer after reduction `d2` to that of said layer before reduction `d1` is from 1.2 to 3.7, and annealing is carried out at a temperature of 200 to 500.degree. C. after reduction.
  9. 20. An electrolytic capacitor using an aluminum foil as an electrode material, wherein said aluminum foil has a sponge-like etching layer formed on at least one surface thereof, said sponge-like etching layer is reduced in the direction of thickness and aluminum density of said sponge-like etching layer after reduction `d2` is set form 0.8 to 2.2 g/cm.sup.3.
  10. 21. An electrolytic capacitor using an aluminum roil as an electrode material, wherein said aluminum foil has a sponge-like etching layer formed on at least one surface thereof, said sponge-like etching layer is reduced in the direction of thickness, aluminum density of said sponge-like etching layer before reduction `d1` is 0.6 g/cm.sup.3 to 1.0 g/cm.sup.3, and aluminum density of said sponge-like etching layer after reduction `d2` is set from 0.8 to 2.2 g/cm.sup.3.
  11. 22. An electrolytic capacitor using an aluminum foil as an electrode material, wherein said aluminum foil has a sponge-like etching layer formed on at least one surface thereof, said sponge-like etching layer is reduced in the direction of thickness, aluminum density of said sponge-like etching layer after reduction `d2` is set from 0.8 to 2.2 g/cm.sup.3, and a ratio `d2/d1` of aluminum density of said sponge-like etching layer after reduction `d2` to that of said layer before reduction `d1` is from 1.2 to 3.7.
  12. 23.23. An electrolytic capacitor using an aluminum foil as an electrode material, wherein said aluminum foil has a sponge-like etching layer formed on at least one surface thereof, said sponge-like etching layer is reduced in the direction of thickness, aluminum density of said sponge-like etching layer before reduction `d1` is 0.6 g/cm.sup.3 to 1.0 g/cm.sup.3, aluminum density of said sponge-like etching layer after reduction `d2` is set from 0.8 to 2.2 g/cm.sup.3, and a ratio `d2/d1` of aluminum density of said sponge-like etching layer after reduction `d2` to that of said layer before reduction `d1` is from 1.2 to 3.7.

References Cited

U.S. Patent Documents

Document NumberAssigneesInventorsIssue/Pub Date
US2079516 MAGNAVOX CO Lilienfeld Apr 1937
US3997339 Siemens Aktiengesellschaft Fickelscher Dec 1976
US4763229 Showa Aluminum Kabushiki Kaisha Ohtuka et al. Aug 1988
US5194127 Asahi Glass Company Ltd. Endoh et al. Mar 1993

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