Join
today
Boliven PRO is more than just patent search
- Build and save lists using the powerful Lists feature
- Analyze and download your search results
- Share patent search results with your clients
Patents »
US6261433: Electro-chemical deposition system and method of electroplating on substrates
Filing Information
Patent Family
29 Claims, 8 Drawings
Abstract
The invention provides an apparatus and a method for achieving reliable, consistent metal electroplating or electrochemical deposition onto semiconductor substrates. More particularly, the invention provides uniform and void-free deposition of metal onto metal seeded semiconductor substrates having sub-micron, high aspect ratio features. The invention provides an electrochemical deposition cell comprising a substrate holder, a cathode electrically contacting a substrate plating surface, an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive a substrate plating surface and an anode electrically connect to an electrolyte. Preferably, a vibrator is attached to the substrate holder to vibrate the substrate in at least one direction, and an auxiliary electrode is disposed adjacent the electrolyte outlet to provide uniform deposition across the substrate surface. Preferably, a periodic reverse current is applied during the plating period to provide a void-free metal layer within high aspect ratio features on the substrate.
- 1. An apparatus for electrochemical deposition of a metal onto a substrate having a substrate plating surface, comprising:
a) a substrate holder adapted to hold the substrate in a position wherein the substrate plating surface is exposed to an electrolyte in an electrolyte container; wherein the substrate holder comprises:
i) a vacuum chuck having a substrate support surface; and
ii) an elastomer ring disposed around the substrate support surface, the elastomer ring contacting a peripheral portion of the substrate;
b) a cathode electrically contacting the substrate plating surface;
c) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive the substrate plating surface; and
d) an anode electrically connected to the electrolyte.
- 3. An apparatus for electrochemical deposition of a metal onto a substrate having a substrate plating surface, comprising:
a) a substrate holder adapted to hold the substrate in a position wherein the substrate plating surface is exposed to an electrolyte in an electrolyte container; wherein the substrate holder comprises:
i) a vacuum chuck having a substrate support surface; and
ii) a gas bladder disposed around the substrate support surface, the gas bladder adapted to contact a peripheral portion of the substrate;
b) a cathode electrically contacting the substrate plating surface;
c) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive the substrate plating surface; and
d) an anode electrically connected to the electrolyte.
- 4. An apparatus for electrochemical deposition of a metal onto a substrate having a substrate plating surface, comprising:
a) a substrate holder adapted to hold the substrate in a position wherein the substrate plating surface is exposed to an electrolyte in an electrolyte container;
b) a cathode electrically contacting the substrate plating surface, wherein the cathode comprises a cathode contact member disposed at a peripheral portion of the substrate plating surface, the cathode contact member having a contact surface adapted to electrically contact the substrate surface, wherein the cathode contact member comprises a radial array of contact pins and a resistor connected in series with each contact pin;
c) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive the substrate plating surface; and
d) an anode electrically connected to the electrolyte.
- 6. An apparatus for electrochemical deposition of a metal onto a substrate having a substrate plating surface, comprising:
a) a substrate holder adapted to hold the substrate in a position wherein the substrate plating surface is exposed to an electrolyte in an electrolyte container;
b) a cathode electrically contacting the substrate plating surface;
c) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive the substrate plating surface, wherein the electrolyte outlet is defined by a gap between a first surface on the substrate holder extending radially outward from the substrate plating surface and a surface of the electrolyte container; and
d) an anode electrically connected to the electrolyte.
- 8. An apparatus for electrochemical deposition of a metal onto a substrate having a substrate plating surface, comprising:
a) a substrate holder adapted to hold the substrate in a position wherein the substrate plating surface is exposed to an electrolyte in an electrolyte container;
b) a cathode electrically contacting the substrate plating surface;
c) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive the substrate plating surface;
d) an anode electrically connected to the electrolyte; and
e) a control electrode disposed in electrical contact with the electrolyte, the control electrode adapted to provide an adjustable electrical power.
- 11. An apparatus for electrochemical deposition of a metal onto a substrate having a substrate plating surface, comprising:
a) a substrate holder adapted to hold the substrate in a position wherein the substrate plating surface is exposed to an electrolyte in an electrolyte container;
b) a cathode electrically contacting the substrate plating surface;
c) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive the substrate plating surface;
d) an anode electrically connected to the electrolyte; and
e) a vibrator attached to the substrate holder, the vibrator transferring a vibration to the substrate holder.
- 13. An apparatus for electrochemical deposition of a metal onto a substrate having a substrate plating surface, comprising:
a) a substrate holder adapted to hold the substrate in a position wherein the substrate plating surface is exposed to an electrolyte in an electrolyte container;
b) a cathode electrically contacting the substrate plating surface;
c) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive the substrate plating surface;
d) an anode electrically connected to the electrolyte; and
e) a sleeve insert disposed at a top portion of the electrolyte container, the sleeve insert defining the opening of the electrolyte container.
- 14. An apparatus for electrochemical deposition of a metal onto a substrate having a substrate plating surface, comprising:
a) a substrate holder adapted to hold the substrate in a position wherein the substrate plating surface is exposed to an electrolyte in an electrolyte container;
b) a cathode electrically contacting the substrate plating surface;
c) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive the substrate plating surface;
d) an anode electrically connected to the electrolyte; and
e) a flow adjuster wedge disposed at a top portion within the electrolyte container.
- 15. An apparatus for electrochemical deposition of a metal onto a substrate having a substrate plating surface, comprising:
a) a substrate holder adapted to hold the substrate in a position wherein the substrate plating surface is exposed to an electrolyte in an electrolyte container,
b) a cathode electrically contacting the substrate plating surface:
c) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive the substrate plating surface,
d) an anode electrically connected to the electrolyte; and
e) a gas knife to supply a gas flow across the wafer plating surface to remove residual electrolyte.
- 16. An apparatus for electrochemical deposition of a metal onto a substrate having a substrate plating surface, comprising:
a) a substrate holder adapted to hold the substrate in a position wherein the substrate plating surface is exposed to an electrolyte in an electrolyte container;
b) a cathode electrically contacting the substrate plating surface;
c) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive the substrate plating surface;
d) an anode electrically connected to the electrolyte; and
e) a wafer catcher disposed at a top portion within the electrolyte container.
- 17. An apparatus for electrochemical deposition of a metal onto a substrate having a substrate plating surface, comprising:
a) a substrate holder adapted to hold the substrate in a position wherein the substrate plating surface is exposed to an electrolyte in an electrolyte container;
b) a cathode electrically contacting the substrate plating surface;
c) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive the substrate plating surface;
d) an anode electrically connected to the electrolyte; and
e) a reference electrode adapted to monitor the cathode and the anode.
- 18. An apparatus for electrochemical deposition of a metal onto a substrate having a substrate plating surface, comprising:
a) a substrate holder adapted to hold the substrate in a position wherein the substrate plating surface is exposed to an electrolyte in an electrolyte container;
b) a cathode electrically contacting the substrate plating surface;
c) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive the substrate plating surface;
d) an anode electrically connected to the electrolyte; and
e) a rinsing solution supply selectively connected to the electrolyte inlet.
- 19. An apparatus for electrochemical deposition of a metal onto a substrate having a substrate plating surface, comprising:
a) a substrate holder adapted to hold the substrate in a position wherein the substrate plating surface is exposed to an electrolyte in an electrolyte container;
b) a cathode electrically contacting the substrate plating surface;
c) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive the substrate plating surface;
d) an anode electrically connected to the electrolyte; and
e) gas bubble diverting vanes disposed within the electrolyte container to divert gas bubbles toward an electrolyte container sidewall.
- 20. A method for electrochemical deposition of a metal onto a substrate, comprising:
a) providing an electrochemical deposition cell comprising:
1) a substrate holder;
2) a cathode electrically contacting a substrate plating surface;
3) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive a substrate plating surface; and
4) an anode electrically connected to an electrolyte;
b) applying electrical power to the cathode and the anode; and
c) flowing an electrolyte to contact the substrate plating surface, wherein the electrolyte flows between about 0.25 gallons per minute (gpm) to about 15 gpm.
- 21. A method for electrochemical deposition of a metal onto a substrate, comprising:
a) providing an electrochemical deposition cell comprising:
1) a substrate holder;
2) a cathode electrically contacting a substrate plating surface;
3) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive a substrate plating surface; and
4) an anode electrically connected to an electrolyte;
b) applying electrical power to the cathode and the anode; and
c) flowing an electrolyte to contact the substrate plating surface;
wherein the step of applying an electrical power to the cathode and the anode comprises:
1) applying a cathodic current density between about 5 mA/cm2 and about 40 mA/cm2 for about 1 second to about 240 seconds.
- 23. A method for electrochemical deposition of a metal onto a substrate, comprising:
a) providing an electrochemical deposition cell comprising:
1) a substrate holder;
2) a cathode electrically contacting a substrate plating surface;
3) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive a substrate plating surface; and
4) an anode electrically connected to an electrolyte;
b) applying electrical power to the cathode and the anode; and
c) flowing an electrolyte to contact the substrate plating surface;
wherein the step of applying an electrical power to the cathode and the anode comprises:
1) applying a cathodic current density between about 5 mA/cm2 and about 40 mA/cm2 for about 1 second to about 240 seconds;
2) applying a dissolution reverse current between about 5 mA/cm2 and about 80 mA/cm2 for about 0.1 seconds to about 100 seconds;
3) applying a cathodic current density between about 5 mA/cm2 and about 40 mA/cm2 for about 1 seconds to about 240 seconds; and
4) repeating step 2 and step 3.
- 24. A method for electrochemical deposition of a metal onto a substrate, comprising:
a) providing an electrochemical deposition cell comprising:
1) a substrate holder;
2) a cathode electrically contacting a substrate plating surface;
3) an electrolyte container having an electrolyte inlet an electrolyte outlet and an opening adapted to receive a substrate plating surface; and
4) an anode electrically connected to an electrolyte;
b) applying electrical power to the cathode and the anode;
c) flowing an electrolyte to contact the substrate plating surface;
d) providing a control electrode in electrical contact with an electrolyte of an electrochemical deposition cell; and
e) adjusting the electrical power provided by the control electrode during deposition.
- 26. A method for electrochemical deposition of a metal onto a substrate, comprising:
a) providing an electrochemical deposition cell comprising;
1) a substrate holder;
2) a cathode electrically contacting a substrate plating surface;
3) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive a substrate plating surface; and
4) an anode electrically connected to an electrolyte;
b) applying electrical power to the cathode and the anode;
c) flowing an electrolyte to contact the substrate plating surface; and
d) vibrating a component of the electrochemical deposition cell in one or more directions.
- 27. A method for electrochemical deposition of a metal onto a substrate, comprising:
a) providing an electrochemical deposition cell comprising:
1) a substrate holder;
2) a cathode electrically contacting a substrate plating surface;
3) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive a substrate plating surface; and
4) an anode electrically connected to an electrolyte;
b) applying electrical power to the cathode and the anode;
c) flowing an electrolyte to contact the substrate plating surface; and
d) vibrating a component of the electrochemical deposition cell at a vibrational frequency between about 10 Hz and about 20,000 Hz and a vibrational amplitude between about 0.5 micron and about 100,000 micron.
- 28. A method for electrochemical deposition of a metal onto a substrate, comprising:
a) providing an electrochemical deposition cell comprising:
1) a substrate holder;
2) a cathode electrically contacting a substrate plating surface;
3) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive a substrate plating surface; and
4) an anode electrically connected to an electrolyte;
b) applying electrical power to the cathode and the anode;
c) flowing an electrolyte to contact the substrate plating surface;
d) rotating the substrate holder about a central axis through the substrate.
- 29. An apparatus for electrochemical deposition of a metal onto a substrate, comprising:
a) a substrate holder comprising:
i) a vacuum chuck having a substrate support surface; and
ii) an elastomer ring disposed around the substrate support surface, the elastomer ring contacting a peripheral portion of the substrate.
b) a cathode electrically contacting a substrate plating surface;
c) an electrolyte container having an electrolyte inlet, an electrolyte outlet and an opening adapted to receive a substrate plating surface, wherein the electrolyte outlet is defined by a gap between a first surface extending radially outward from the substrate plating surface and a surface of the electrolyte container;
d) an anode electrically connected to an electrolyte, the anode comprising:
i) a porous enclosure for flow of an electrolyte therethrough;
ii) a metal disposed within the enclosure; and
iii) an electrode disposed within the enclosure;
e) a control electrode in electrical contact with an electrolyte, the control electrode adapted to provide an adjustable electrical power; and
f) a vibrator attached to the substrate holder, the vibrator adapted to transfer a vibration in one or more directions to the substrate holder.
References Cited
U.S. Patent Documents
| Document Number | Assignees | Inventors | Issue/Pub Date |
| US3649509 |
BUCKBEE MEARS CO |
Morawetz et al. |
Mar 1972 |
| US3727620 |
FLUOROWARE OF CALIFORNIA INC |
Orr |
Apr 1973 |
| US3770598 |
OXY METAL FINISHING CORP |
Creutz |
Nov 1973 |
| US4027686 |
Texas Instruments Incorporated |
Shortes et al. |
Jun 1977 |
| US4092176 |
Nippon Electric Co., Ltd. |
Kozai et al. |
May 1978 |
| US4110176 |
Oxy Metal Industries Corporation |
Creutz, et al. |
Aug 1978 |
| US4113492 |
Fuji Photo Film Co., Ltd. |
Sato et al. |
Sep 1978 |
| US4315059 |
The United States of America as represented by the United States Department of Energy |
Raistrick et al. |
Feb 1982 |
| US4326940 |
ROHCO Incorporated |
Eckles et al. |
Apr 1982 |
| US4336114 |
Hooker Chemicals & Plastics Corp. |
Mayer et al. |
Jun 1982 |
| US4376685 |
M&T Chemicals Inc. |
Watson |
Mar 1983 |
| US4405416 |
|
Raistrick et al. |
Sep 1983 |
| US4428815 |
Western Electric Co., Inc. |
Powell et al. |
Jan 1984 |
| US4435266 |
EMI Limited |
Johnston |
Mar 1984 |
| US4489740 |
General Signal Corporation |
Rattan et al. |
Dec 1984 |
| US4510176 |
AT&T Bell Laboratories |
Cuthbert et al. |
Apr 1985 |
| US4518678 |
Advanced Micro Devices, Inc. |
Allen |
May 1985 |
| US4519846 |
AIGO SEIICHIRO |
Aigo |
May 1985 |
| US4693805 |
BOE Limited |
Quazi |
Sep 1987 |
| US4732785 |
Motorola, Inc. |
Brewer |
Mar 1988 |
| US4789445 |
ASARCO Incorporated |
Goffman et al. |
Dec 1988 |
| US5039381 |
MULLARKEY EDWARD J |
Mullarkey |
Aug 1991 |
| US5055425 |
Hewlett-Packard Company |
Leibovitz et al. |
Oct 1991 |
| US5092975 |
Yamaha Corporation |
Yamamura et al. |
Mar 1992 |
| US5155336 |
Applied Materials, Inc. |
Gronet et al. |
Oct 1992 |
| US5162260 |
Hewlett-Packard Company |
Leibovitz et al. |
Nov 1992 |
| US5222310 |
Semitool, Inc. |
Thompson et al. |
Jun 1993 |
| US5224504 |
Semitool, Inc. |
Thompson et al. |
Jul 1993 |
| US5230743 |
Semitool, Inc. |
Thompson et al. |
Jul 1993 |
| US5252807 |
CHIZINSKY GEORGE |
Chizinsky |
Oct 1993 |
| US5256274 |
PORIS JAIME |
Poris |
Oct 1993 |
| US5259407 |
Matrix Inc. |
Tuchida et al. |
Nov 1993 |
| US5290361 |
Wako Pure Chemical Industries, Ltd. |
Hayashida et al. |
Mar 1994 |
| US5316974 |
Texas Instruments Incorporated |
Crank |
May 1994 |
| US5328589 |
Enthone-OMI, Inc. |
Martin |
Jul 1994 |
| US5349978 |
Tokyo Ohka Kogyo Co., Ltd. |
Sago et al. |
Sep 1994 |
| US5368711 |
|
Poris |
Nov 1994 |
| US5377708 |
Semitool, Inc. |
Bergman et al. |
Jan 1995 |
| US5429733* |
Electroplating Engineers of Japan, Ltd. |
Ishida |
Jul 1995 |
| US5447615* |
Electroplating Engineers Of Japan Limited |
Ishida |
Sep 1995 |
| US5516412 |
International Business Machines Corporation |
Andricacos et al. |
May 1996 |
| US5608943 |
Tokyo Electron Limited |
Konishi et al. |
Mar 1997 |
| US5625170 |
Nanometrics Incorporated |
Poris |
Apr 1997 |
| US5651865 |
ENI |
Sellers |
Jul 1997 |
| US5705223 |
International Business Machine Corp. |
Bunkofske |
Jan 1998 |
| US5718813 |
Advanced Energy Industries, Inc. |
Drummond et al. |
Feb 1998 |
| US5723028 |
|
Poris |
Mar 1998 |
Foreign Patent Documents
* cited by examiner
Other Publications
| PCT Written Opinion citing additional references for PCT/US 99/28159, dated Dec. 8, 2000. |
| PCT International Search Report dated Feb. 7, 2000. |
| Kenneth E. Pitney, “NEY Contact Manual,” Electrical Contacts for Low Energy Uses, 1973, no month available. |
| Lucio Colombo, “Wafer Back Surface Film Removal,” Central R&D, SGS-Thompson, Microelectronics, Agrate, Italy, 6 pages, no month/year available. |
| Semitool©, Inc., “Metallization & Interconnect,” 1998, 4 pages, no month available. |
| Verteq Online©, “Products Overview,” 1996-1998, 5 pages, no month available. |
| Laurell Technologies Corporation, “Two control configurations available-see |
| Peter Singer, “Tantalum, Copper and Damascene: The Future of Interconnects,” Semiconductor International, Jun. 1998, Pages cover, 91-92,94,96 & 98. |
| Peter Singer, “Wafer Processing,” Semiconductor International, Jun., 1998, p. 70. |
Referenced By
| Document Number | Assignee | Inventors | Issue/Pub Date |
|
EP1932951
|
PRIOR Engineering Services AG
|
Adalbert Prior
|
Jun 2008
|
|
US8313631
|
Applied Materials Inc.
|
Paul R. McHugh et al.
|
Nov 2012
|
|
US8308931
|
Novellus Systems, Inc.
|
Jonathan Reid et al.
|
Nov 2012
|
|
US8138091
|
Cabot Microelectronics Corporation
|
Jeffrey M. Dysard et al.
|
Mar 2012
|
|
US6440291
|
Novellus Systems, Inc.
|
Jon Henri et al.
|
Aug 2002
|
|
US6855235
|
Applied Materials, Inc.
|
Harald Herchen et al.
|
Feb 2005
|
|
US6843897
|
Applied Materials, Inc.
|
Harald Herchen et al.
|
Jan 2005
|
|
US7214297
|
Applied Materials, Inc.
|
You Wang et al.
|
May 2007
|
|
US7211175
|
Novellus Systems, Inc.
|
Steven T. Mayer et al.
|
May 2007
|
|
US7332066
|
Semitool, Inc.
|
Linlin Chen et al.
|
Feb 2008
|
|
US7427338
|
Applied Materials, Inc.
|
Yezdi N. Dordi et al.
|
Sep 2008
|
|
US7585398
|
Semitool, Inc.
|
Kyle M. Hanson et al.
|
Sep 2009
|
|
US6824665
|
Shipley Company, L.L.C.
|
James G. Shelnut et al.
|
Nov 2004
|
|
US6824612
|
Applied Materials, Inc.
|
Joseph J. Stevens et al.
|
Nov 2004
|
|
US6755946
|
Novellus Systems, Inc.
|
Evan E. Patton et al.
|
Jun 2004
|
|
US7090751
|
Semitool, Inc.
|
Kyle M. Hanson
|
Aug 2006
|
|
US7077725
|
Applied Materials, Inc.
|
Lizhong Sun et al.
|
Jul 2006
|
|
US7264698
|
Semitool, Inc.
|
Kyle M. Hanson et al.
|
Sep 2007
|
|
US6726826
|
Motorola, Inc.
|
Timothy Lee Johnson et al.
|
Apr 2004
|
|
US7247222
|
Applied Materials, Inc.
|
Michael X. Yang et al.
|
Jul 2007
|
|
US7285195
|
Applied Materials, Inc.
|
Harald Herchen et al.
|
Oct 2007
|
|
US7232513
|
Novellus Systems, Inc.
|
Eric G. Webb et al.
|
Jun 2007
|
|
US7553400
|
Ebara Corporation
|
Mizuki Nagai et al.
|
Jun 2009
|
|
US6695962
|
NuTool Inc.
|
Cyprian E. Uzoh et al.
|
Feb 2004
|
|
US6739951
|
Applied Materials Inc.
|
Lizhong Sun et al.
|
May 2004
|
|
US6808612
|
Applied Materials, Inc.
|
Peter Hey et al.
|
Oct 2004
|
|
US7247223
|
Semitool, Inc.
|
Paul R. McHugh et al.
|
Jul 2007
|
|
US7223323
|
Applied Materials, Inc.
|
Michael X. Yang et al.
|
May 2007
|
|
US7438788
|
Semitool, Inc.
|
Kyle M. Hanson et al.
|
Oct 2008
|
|
US6610189
|
Applied Materials, Inc.
|
Hougong Wang et al.
|
Aug 2003
|
|
US6913680
|
Applied Materials, Inc.
|
Bo Zheng et al.
|
Jul 2005
|
|
US6875322
|
Lam Research Corporation
|
Rodney C. Kistler
|
Apr 2005
|
|
US6746565
|
Semitool, Inc.
|
Martin C. Bleck et al.
|
Jun 2004
|
|
US6818556
|
Kabushiki Kaisha Toshiba
|
Yoshihiro Uozumi
|
Nov 2004
|
|
US7183203
|
Kabushiki Kaisha Toshiba
|
Yoshihiro Uozumi
|
Feb 2007
|
|
US7189647
|
Novellus Systems, Inc.
|
Evan E. Patton et al.
|
Mar 2007
|
|
US7531105
|
Cabot Microelectronics Corporation
|
Jeffrey M. Dysard et al.
|
May 2009
|
|
US6516815
|
Applied Materials, Inc.
|
Joe Stevens et al.
|
Feb 2003
|
|
US6613200
|
Applied Materials, Inc.
|
Shijian Li et al.
|
Sep 2003
|
|
US6884335
|
Novellus Systems, Inc.
|
Eric G. Webb et al.
|
Apr 2005
|
|
US6911136
|
Applied Materials, Inc.
|
Bo Zheng et al.
|
Jun 2005
|
|
US7033465
|
Novellus Systems, Inc.
|
Evan E. Patton et al.
|
Apr 2006
|
|
US7001492
|
Micron Technology, Inc.
|
Dale W. Collins
|
Feb 2006
|
|
US7351315
|
Semitool, Inc.
|
John Klocke et al.
|
Apr 2008
|
|
US7189318
|
Semitool, Inc.
|
Gregory J. Wilson et al.
|
Mar 2007
|
|
US7566386
|
Semitool, Inc.
|
Gregory J. Wilson et al.
|
Jul 2009
|
|
US6379223
|
Applied Materials, Inc.
|
Lizhong Sun et al.
|
Apr 2002
|
|
US6585876
|
Applied Materials Inc.
|
Yezdi N. Dordi et al.
|
Jul 2003
|
|
US6793795
|
Atotech Deutschland GmbH
|
Heinrich Meyer et al.
|
Sep 2004
|
|
US7115196
|
Semitool, Inc.
|
Linlin Chen et al.
|
Oct 2006
|
|
US7025862
|
Applied Materials
|
Harald Herchen et al.
|
Apr 2006
|
|
US7227265
|
International Business Machines Corporation
|
Panayotis C. Andricacos et al.
|
Jun 2007
|
|
US7351314
|
Semitool, Inc.
|
John Klocke et al.
|
Apr 2008
|
|
US7189313
|
Applied Materials, Inc.
|
Dmitry Lubomirsky
|
Mar 2007
|
|
US7504044
|
Cabot Microelectronics Corporation
|
Phillip W. Carter et al.
|
Mar 2009
|
|
US6576110
|
Applied Materials, Inc.
|
Dan Maydan
|
Jun 2003
|
|
US6875331
|
Applied Materials, Inc.
|
Harald Herchen
|
Apr 2005
|
|
US6830673
|
Applied Materials, Inc.
|
Joseph Yahalom et al.
|
Dec 2004
|
|
US6746591
|
Applied Materials Inc.
|
Bo Zheng et al.
|
Jun 2004
|
|
US7169269
|
Dainippon Screen Mfg. Co., Ltd.
|
Yasuhiro Mizohata et al.
|
Jan 2007
|
|
US7195696
|
Novellus Systems, Inc.
|
Cyprian E. Uzoh et al.
|
Mar 2007
|
|
US7267749
|
Semitool, Inc.
|
Gregory J. Wilson et al.
|
Sep 2007
|
|
US6723219
|
Micron Technology, Inc.
|
Dale W. Collins
|
Apr 2004
|
|
US7160421
|
Semitool, Inc.
|
Gregory J. Wilson et al.
|
Jan 2007
|
|
US7273535
|
Applied Materials, Inc.
|
Nicolay Y. Kovarsky et al.
|
Sep 2007
|
|
US6649038
|
Shipley Company, L.L.C.
|
Robert D. Mikkola et al.
|
Nov 2003
|
|
US6896786
|
LuK, Fahrzeug-Hydraulik GmbH & Co. KG
|
Christof Lausser et al.
|
May 2005
|
|
US6830666
|
Micron Technology, Inc.
|
Scott E. Moore
|
Dec 2004
|
|
US7387717
|
Ebara Corporation
|
Junji Kunisawa et al.
|
Jun 2008
|
|
US6766813
|
Board of Regents, The University of Texas System
|
Anthony Sayka et al.
|
Jul 2004
|
|
US7020537
|
Semitool, Inc.
|
Gregory J. Wilson et al.
|
Mar 2006
|
|
US7141146
|
ASM Nutool, Inc.
|
Jeffrey Bogart et al.
|
Nov 2006
|
|
US7128823
|
Applied Materials, Inc.
|
Michael X. Yang et al.
|
Oct 2006
|
|
US7909976
|
Shinko Electric Industries Co., Ltd.
|
Naohiro Mashino
|
Mar 2011
|
|
US7655126
|
Federal Mogul World Wide, Inc.
|
Yuefeng Luo
|
Feb 2010
|
|
US7670465
|
Applied Materials, Inc.
|
Michael X. Yang et al.
|
Mar 2010
|
|
US7686927
|
Novellus Systems, Inc.
|
Jonathan D. Reid et al.
|
Mar 2010
|
|
US7704352
|
Applied Materials, Inc.
|
Sergey Lopatin et al.
|
Apr 2010
|
|
US7727364
|
Applied Materials, Inc.
|
Saravjeet Singh et al.
|
Jun 2010
|
|
US7736928
|
Applied Materials, Inc.
|
Sergey Lopatin et al.
|
Jun 2010
|
|
US7776741
|
Novellus Systems, Inc.
|
Jonathan D. Reid et al.
|
Aug 2010
|
|
US7799182
|
Applied Materials, Inc.
|
Sergey Lopatin et al.
|
Sep 2010
|
|
US7837851
|
Applied Materials, Inc.
|
Manoocher Birang et al.
|
Nov 2010
|
|
US7837841
|
Taiwan Semiconductor Manufacturing Co., Ltd.
|
Kei-Wei Chen et al.
|
Nov 2010
|
|
US7842173
|
Semitool, Inc.
|
Paul R. McHugh et al.
|
Nov 2010
|
|
US7842169
|
Applied Materials, Inc.
|
Stan Tsai et al.
|
Nov 2010
|
|
US7846842
|
Cabot Microelectronics Corporation
|
Phillip W. Carter et al.
|
Dec 2010
|
|
US7854828
|
Novellus Systems, Inc.
|
Jonathan Reid et al.
|
Dec 2010
|
|
US7857958
|
Semitool, Inc.
|
Paul R. McHugh et al.
|
Dec 2010
|
|
US6916412
|
Semitool, Inc.
|
Daniel J. Woodruff et al.
|
Jul 2005
|
|
US6893550
|
Intel Corporation
|
Valery Dubin et al.
|
May 2005
|
|
US7147760
|
Semitool, Inc.
|
Daniel J. Woodruff et al.
|
Dec 2006
|
|
US7335288
|
Novellus Systems, Inc.
|
Vishwas V. Hardikar
|
Feb 2008
|
|
US7357850
|
Semitool, Inc.
|
Daniel J. Woodruff et al.
|
Apr 2008
|
|
US6811670
|
Taiwan Semiconductor Manufacturing Co., Ltd
|
Chung-Shi Liu et al.
|
Nov 2004
|
|
US7922877
|
Utac Thai Limited
|
Chalermsak Sumithpibul et al.
|
Apr 2011
|
|
US7935231
|
Novellus Systems, Inc.
|
Shantinath Ghongadi et al.
|
May 2011
|
|
US7985325
|
Novellus Systems, Inc.
|
Robert Rash et al.
|
Jul 2011
|
|
US7981259
|
Applied Materials, Inc.
|
Hooman Hafezi et al.
|
Jul 2011
|
|
US8003159
|
Lam Research Corporation
|
Igor C. Ivanov et al.
|
Aug 2011
|
Patent Family
The current document is not in a family.
Boliven’s Predicted Expiration Date includes in its calculation the number of days of patent term adjustment a U.S. patent is entitled. The Predicted Expiration Date does not, currently, include in its calculation the payment of maintenance fees, the filing of any disclaimer(s), and/or patent term extension, but Boliven is working to include this information in the near future.